Electronics Lab

Our electronics lab is for electrical analysis of graphene products.

For access to the lab, or for any general training, please contact the lab leader Dr Xiao Zhang or their deputy Dr Yang Li.

While there is a range of devices in the electronics lab, several of them require booking before use.

The booking system can be found here.

Physical Property Measurement System (PPMS) - DynoCool From Quantum Design

Principal User: Dr Yang Li
Deputy: Dr Xiao Zhang

A closed cycle refrigerator based testing system, which operates from 1.8 K to 400 K. The system allows +/- 14 Tesla to be applied at all temperatures of operation. Electrical transport and DC resistivity measurements can be performed. Cooling down to 1.8 K from room temperature can be achieved in 1 h.

The tool is also equipped with a dilution refrigerator, which allows samples to be cooled to temperatures as low as 50 mK.

Lakeshore Probe Station

Principal User: Dr Yang Li
Deputy:Dr Dharmaraj Periyanagounder

A cryogen-free, closed-cycle refrigerator probe station enhanced with a vertical field superconducting magnet of ±2.5 T and temperature control of 10 K to 500 K. C-V, I-V, microwave, electro-optical probing and out-of-plane vertical magnetic field measurements are executable.

Cascade Probe Station

Principal User: Dr Dharmaraj Periyanagounder
Deputy: Mr Petros Symeon

A Cascade Summit series semi-automated probe system with loading wafer size large up to 200 mm in diameter. High-precision device characterisations and on-wafer RF/microwave measurements (up to 1.1THz) with wafer-level reliability and yield enhancement are accessible on this probe station.

EverBeing Probe Station

Principal User: Dr Xiao Zhang
Deputy: Dr Yang Li

4-inch coaxial chuck stage-based electrical probe station integrated with 4 high-precision SMUs, making this facility available to many electrical measurements, such as I-V, impedance, sheet resistance and contact resistance over various materials at room temperature.

Scanning Microwave Microscope (SMM)

Principal User: D r Xiao Zhang
Deputy: D r Yang Li

This system integrates the electrical measurement capabilities of a vector network analyser with the spatial resolution of an atomic force microscope, and is capable of mapping many properties of materials, such as impedance, capacitance, dielectric constant and dopant concentration etc.