skip to primary navigationskip to content

Cambridge Graphene Centre

Research Centre on Graphene, Layered Crystals and Hybrid Nanomaterials

Studying at Cambridge

 

AFM

Our Atomic-Force Microscopy Lab is for examing structures on the atomic scale.

 

For access to the lab, or for any general training, please contact the lab leader Matteo Barbone, or their deputy Anna Ott.  For training on any of the equipment, please contact the Principal User or their deputy for the listed equipment.

All equipment in the SEM room needs to be booked before use. The booking system can be found here.

 

Bruker Dimension Icon Atomic Force Microscope


Principal User: Matteo Barbone
Deputy: Anna Ott

Used for surface characterisation of samples.

Capabilities:
1. Topography modes:
     • PeakForce Tapping (with ScanAsyst)
     • Tapping mode
     • Phase Imaging
     • Contact mode
2. Electrical modes
     • PeakForce Tunnelling AFM (PFTUNA)
     • Kelvin Probe Force Microscopy (KPFM)
     • Scanning Capacitance Microscopy (SCM)
     • Electric Force Microscopy (EFM)
     • Scanning Tunnelling Microscopy (STM)
3. Magnetic Force Microscopy (MFM)
4. PeakForce Quantitative Nanomechanical Mapping (PFQNM)
5. Lateral Force Microscopy
6. Microscope Image Registration & Overlay option (MIRO)
7. Heating/Cooling Temperature Controller (–35 ℃ to 250 ℃ )

AFM.jpg

Bruker DektakXT Stylus Profilometer


Principal User: Matteo Barbone
Deputy: Anna Ott

Used for thickness/step measurements and 3D mapping.

Capabilities:
1. Line scans
2. 3D Mapping
3. Wafer sized samples
4. Scan length between 50 µm and 55,000 µm (55 mm) for a non-stitched measurement
5. Stitching capability for scan length of 55mm to 200mm
6. User-programmable stylus force from 1 mg to 15 mg
7. Z resolution:
     • 6.5 µm range provides a vertical bit resolution of 0.1 nm.
     • For general applications, the 1.0 nm vertical resolution of the 65.5 µm range is usually adequate.
     • When measuring thick films or very rough or curved samples, select the 524 µm range with 8.0 nm resolution.

Profilometer.jpg

 

When in the AFM laboratory, please follow the local rules, downloadable here.

 

Photos by Samuel Curtis Photography

RSS Feed Latest news

Let there be Light: Deterministic arrays of Quantum Dots

May 22, 2017

Large scale, fully integrable arrays of single photon quantum emitters are demonstrated in layered materials, which could lead to hybrid on-chip photonics devices for networks and sensing.

Cambridge Graphene Centre Technology Day

May 17, 2017

On 25th May, the Cambridge Graphene Centre’s industrial partners will gather in Cambridge for a day of networking, exhibitions and panel discussions.

Graphene inks mesmerise in EPSRC Photography Competition

Apr 03, 2017

James Macleod's stunning image of graphene inks has scooped more prizes in the 2017 EPSRC Photography Competition

Prof. Ferrari Awarded NANOSMAT Award 2017

Mar 30, 2017

Congratulations to Prof. Ferrari, who has been announced as the recipient of the NANOSMAT Award 2017 for "outstanding" contributions to nanoscience and nanotechnology.

Scalable 100% Yield Production of Conductive Graphene Inks

Feb 21, 2017

Conductive inks based on graphene and layered materials are key for low-cost manufacturing of flexible electronics, novel energy solutions, composites and coatings. A new method for liquid-phase exfoliation of graphite paves the way for scalable production.

View all news